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dc.contributorCarlos A. Murillo Program Manageren_US
dc.contributorJoseph Gardella |Frank Bright |David Watson |Sarbajit Banerjee |en_US
dc.contributor.authorColon, Luis Principal Investigatoren_US
dc.contributor.otherlacolon@buffalo.eduen_US
dc.dateNovember 30, 2013en_US
dc.date.accessioned2011-04-08T19:27:45Zen_US
dc.date.accessioned2011-04-19T18:33:54Z
dc.date.availableDecember 15, 2010en_US
dc.date.available2011-04-08T19:27:45Zen_US
dc.date.available2011-04-19T18:33:54Z
dc.date.issued2011-04-08T19:27:45Zen_US
dc.identifier1048740en_US
dc.identifier1048740en_US
dc.identifier.urihttp://hdl.handle.net/10477/1261
dc.descriptionGrant Amount: $ 450000en_US
dc.description.abstractWith this award from the Chemistry Research Instrumentation and Facilities: Multi-user (CRIF:MU) program, Professor Luis Colon and colleagues Sarbajit Banerjee, Frank Bright, Joseph Gardella and David Watson from SUNY Buffalo will acquire an X-ray photoelectron spectrometer (XPS). The award will enhance research training and education at all levels, especially in areas of study such as (a) surface aggregation and reorganization of polymeric materials, (b) correlation of electronic structure of nanomaterials to finite size effects on material properties, (b) protein behavior dynamics in restricted microenvironments, (c) fundamental studies of silica imprinted nanostructures, and (d) linked-assisted materials assembly that have quantum dots. X-ray photoelectron spectrometers are used for chemical analysis. The XPS technique quantitatively measures elemental composition, empirical formula, chemical state and electronic state of the elements in a given material. A sample is irradiated with a beam of monochromatic X-rays and the kinetic energies of the resulting photoelectrons are measured and related to specific elements. XPS often plays a crucial role in defining the system under study. The technique requires the use of ultra high vacuum conditions. The work to be carried out by these investigators represents a wide array of systems requiring surface characterization. The instrumentation will be used in research activities and also for research training and education of a large number of students from diverse backgrounds.en_US
dc.titleCRIF-MU: Acquisition of an X-Ray photoelectron spectrometer (XPS) for small area and depth profiling analysisen_US
dc.typeNSF Granten_US


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